Special Issue
Surface Characterization using Accelerators (Guest Editors: D. K Avasthi and N. C. Mishra)
Vol. 080 (pp. 1531-1575), 2001
Vol. 080 (pp. 1531-1575), 2001
- Preface | June 2001, 80 (12) DjVu | PDF
- ERDA with swift heavy ions for materials characterization | June 2001, 80 (12) DjVu | PDF
; - Proton Induced X-ray Emission - A tool for non-destructive trace element analysis | June 2001, 80 (12) DjVu | PDF
- Surface and near-surface modifications and analysis by MeV ions | June 2001, 80 (12) DjVu | PDF
- Swift heavy ion-induced modification and track formation in materials | June 2001, 80 (12) DjVu | PDF
- Irradiation effects of swift heavy ions on gallium arsenide, silicon and silicon diodes | June 2001, 80 (12) DjVu | PDF
